Fingerprint reference point detemination based on a novel ridgeline feature

Shan Juan Xie, Hyouck Min Yoo, Dong-Sun Park, Sook Yoon. Fingerprint reference point detemination based on a novel ridgeline feature. In Proceedings of the International Conference on Image Processing, ICIP 2010, September 26-29, Hong Kong, China. pages 3073-3076, IEEE, 2010. [doi]

Authors

Shan Juan Xie

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Hyouck Min Yoo

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Dong-Sun Park

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Sook Yoon

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