Weikun Xie, Huibin Zhang, Qiuli Zhang. Testing FPGA devices on an Automatic Test Equipment. In IEEE International Conference on Information and Automation, ICIA 2013, Yinchuan, China, August 26-28, 2013. pages 65-70, IEEE, 2013. [doi]
@inproceedings{XieZZ13-1,
title = {Testing FPGA devices on an Automatic Test Equipment},
author = {Weikun Xie and Huibin Zhang and Qiuli Zhang},
year = {2013},
doi = {10.1109/ICInfA.2013.6720271},
url = {https://doi.org/10.1109/ICInfA.2013.6720271},
researchr = {https://researchr.org/publication/XieZZ13-1},
cites = {0},
citedby = {0},
pages = {65-70},
booktitle = {IEEE International Conference on Information and Automation, ICIA 2013, Yinchuan, China, August 26-28, 2013},
publisher = {IEEE},
}