Fault detection applied on industrial process based on knowledge from a Bayesian perspective - researchr publication authors

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Ying Xie, Yingwei Zhang, Lirong Zhai. Fault detection applied on industrial process based on knowledge from a Bayesian perspective. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 6788-6793, IEEE, 2016. [doi]

This author has not been identified. Look up 'Ying Xie' in GoogleThis author has not been identified. Look up 'Yingwei Zhang' in GoogleThis author has not been identified. Look up 'Lirong Zhai' in Google

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