Extracting redundancy-aware top-k patterns - researchr publication authors

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Dong Xin, Hong Cheng, Xifeng Yan, Jiawei Han. Extracting redundancy-aware top-k patterns. In Tina Eliassi-Rad, Lyle H. Ungar, Mark Craven, Dimitrios Gunopulos, editors, Proceedings of the Twelfth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Philadelphia, PA, USA, August 20-23, 2006. pages 444-453, ACM, 2006. [doi]

This author has not been identified. Look up 'Dong Xin' in GoogleThis author has not been identified. Look up 'Hong Cheng' in GoogleThis author has not been identified. Look up 'Xifeng Yan' in GoogleThis author has not been identified. Look up 'Jiawei Han' in Google

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