Jingmin Xin, Sijie Liu, Yangyang Deng, Nanning Zheng. Vulnerable Plaque Recognition Based on Attention Model with Deep Convolutional Neural Network. In 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2018, Honolulu, HI, USA, July 18-21, 2018. pages 834-837, IEEE, 2018. [doi]
@inproceedings{XinLDZ18,
title = {Vulnerable Plaque Recognition Based on Attention Model with Deep Convolutional Neural Network},
author = {Jingmin Xin and Sijie Liu and Yangyang Deng and Nanning Zheng},
year = {2018},
doi = {10.1109/EMBC.2018.8512279},
url = {https://doi.org/10.1109/EMBC.2018.8512279},
researchr = {https://researchr.org/publication/XinLDZ18},
cites = {0},
citedby = {0},
pages = {834-837},
booktitle = {40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2018, Honolulu, HI, USA, July 18-21, 2018},
publisher = {IEEE},
isbn = {978-1-5386-3646-6},
}