Built-in self test design of power switch with clock-gated charge/discharge transistor

Chen Xin, Wu Ning, Bai Na, Huang Hui, Hu Wei. Built-in self test design of power switch with clock-gated charge/discharge transistor. IET Computers & Digital Techniques, 8(2):59-69, 2014. [doi]

Authors

Chen Xin

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Wu Ning

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Bai Na

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Huang Hui

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Hu Wei

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