Hanqing Xing, Degang Chen, Randall L. Geiger. Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]
@inproceedings{XingCG06,
title = {Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs},
author = {Hanqing Xing and Degang Chen and Randall L. Geiger},
year = {2006},
doi = {10.1109/ISCAS.2006.1693123},
url = {http://dx.doi.org/10.1109/ISCAS.2006.1693123},
tags = {testing},
researchr = {https://researchr.org/publication/XingCG06},
cites = {0},
citedby = {0},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece},
publisher = {IEEE},
}