Yizi Xing, Liquan Fang. Design-for-Test of Digitally-Assisted Analog IPs for Automotive SoCs. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 185-191, IEEE Computer Society, 2010. [doi]
@inproceedings{XingF10,
title = {Design-for-Test of Digitally-Assisted Analog IPs for Automotive SoCs},
author = {Yizi Xing and Liquan Fang},
year = {2010},
doi = {10.1109/ATS.2010.41},
url = {http://dx.doi.org/10.1109/ATS.2010.41},
researchr = {https://researchr.org/publication/XingF10},
cites = {0},
citedby = {0},
pages = {185-191},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}