Qin Xiong, Fei Wu 0005, Zhonghai Lu, Yue Zhu, You Zhou, Yibing Chu, Changsheng Xie, Ping Huang. Characterizing 3D Floating Gate NAND Flash: Observations, Analyses, and Implications. TOS, 14(2), 2018. [doi]
@article{XiongWLZZCXH18,
title = {Characterizing 3D Floating Gate NAND Flash: Observations, Analyses, and Implications},
author = {Qin Xiong and Fei Wu 0005 and Zhonghai Lu and Yue Zhu and You Zhou and Yibing Chu and Changsheng Xie and Ping Huang},
year = {2018},
doi = {10.1145/3162616},
url = {http://doi.acm.org/10.1145/3162616},
researchr = {https://researchr.org/publication/XiongWLZZCXH18},
cites = {0},
citedby = {0},
journal = {TOS},
volume = {14},
number = {2},
}