Local binary pattern probability model based facial feature localization - researchr publication authors

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Tao Xiong, Lei Xu, Kongqiao Wang, Jiangwei Li, Yong Ma. Local binary pattern probability model based facial feature localization. In Proceedings of the International Conference on Image Processing, ICIP 2010, September 26-29, Hong Kong, China. pages 1425-1428, IEEE, 2010. [doi]

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