Shiyi Xu. High-Order Syndrome Testing for VLSI Circuits. In 11th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2005), 12-14 December, 2005, Changsha, Hunan, China. pages 101-108, IEEE Computer Society, 2005. [doi]
@inproceedings{Xu05:21,
title = {High-Order Syndrome Testing for VLSI Circuits},
author = {Shiyi Xu},
year = {2005},
doi = {10.1109/PRDC.2005.36},
url = {http://doi.ieeecomputersociety.org/10.1109/PRDC.2005.36},
tags = {testing},
researchr = {https://researchr.org/publication/Xu05%3A21},
cites = {0},
citedby = {0},
pages = {101-108},
booktitle = {11th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2005), 12-14 December, 2005, Changsha, Hunan, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-2492-3},
}