Using Statistical Models to Improve the Reliability of Delay-Based PUFs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Xiaolin Xu, Wayne Burleson, Daniel E. Holcomb. Using Statistical Models to Improve the Reliability of Delay-Based PUFs. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 547-552, IEEE, 2016. [doi]

This author has not been identified. Look up 'Xiaolin Xu' in GoogleThis author has not been identified. Look up 'Wayne Burleson' in GoogleThis author has not been identified. Look up 'Daniel E. Holcomb' in Google

runs on WebDSL