Li Xu, Degang Chen. ADC spectral testing allowing amplitude clipping. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, Minneapolis, MN, USA, May 6-9, 2013. pages 1526-1529, IEEE, 2013. [doi]
@inproceedings{XuC13-9,
title = {ADC spectral testing allowing amplitude clipping},
author = {Li Xu and Degang Chen},
year = {2013},
doi = {10.1109/I2MTC.2013.6555669},
url = {https://doi.org/10.1109/I2MTC.2013.6555669},
researchr = {https://researchr.org/publication/XuC13-9},
cites = {0},
citedby = {0},
pages = {1526-1529},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, Minneapolis, MN, USA, May 6-9, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4621-4},
}