Full-Wave Simulation and Analysis of Bistatic Scattering and Polarimetric Emissions From Double-Layered Sastrugi Surfaces

Peng Xu, Kun-Shan Chen, Yu Liu, Jiancheng Shi 0001, Chong Peng, Rui Jiang, Jiangyuan Zeng. Full-Wave Simulation and Analysis of Bistatic Scattering and Polarimetric Emissions From Double-Layered Sastrugi Surfaces. IEEE T. Geoscience and Remote Sensing, 55(1):292-307, 2017. [doi]

@article{XuCLSPJZ17,
  title = {Full-Wave Simulation and Analysis of Bistatic Scattering and Polarimetric Emissions From Double-Layered Sastrugi Surfaces},
  author = {Peng Xu and Kun-Shan Chen and Yu Liu and Jiancheng Shi 0001 and Chong Peng and Rui Jiang and Jiangyuan Zeng},
  year = {2017},
  doi = {10.1109/TGRS.2016.2606323},
  url = {http://dx.doi.org/10.1109/TGRS.2016.2606323},
  researchr = {https://researchr.org/publication/XuCLSPJZ17},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Geoscience and Remote Sensing},
  volume = {55},
  number = {1},
  pages = {292-307},
}