Feiyang Xu, Yue Ding, Zhenhua Ling, Xin Li, Yunxia Li, Shijin Wang. DCDT: A Digital Clock Drawing Test System for Cognitive Impairment Screening. In 36th IEEE International Conference on Data Engineering, ICDE 2020, Dallas, TX, USA, April 20-24, 2020. pages 1762-1765, IEEE, 2020. [doi]
@inproceedings{XuDLLLW20,
title = {DCDT: A Digital Clock Drawing Test System for Cognitive Impairment Screening},
author = {Feiyang Xu and Yue Ding and Zhenhua Ling and Xin Li and Yunxia Li and Shijin Wang},
year = {2020},
doi = {10.1109/ICDE48307.2020.00164},
url = {https://doi.org/10.1109/ICDE48307.2020.00164},
researchr = {https://researchr.org/publication/XuDLLLW20},
cites = {0},
citedby = {0},
pages = {1762-1765},
booktitle = {36th IEEE International Conference on Data Engineering, ICDE 2020, Dallas, TX, USA, April 20-24, 2020},
publisher = {IEEE},
isbn = {978-1-7281-2903-7},
}