Hai Xu, Hee-Jun Kim, Won-Sup Chung. Experimental Identification Method for Small-Signal Analysis of Smart Power ICs. IEEE Transactions on Industrial Electronics, 57(6):2142-2150, 2010. [doi]
@article{XuKC10,
title = {Experimental Identification Method for Small-Signal Analysis of Smart Power ICs},
author = {Hai Xu and Hee-Jun Kim and Won-Sup Chung},
year = {2010},
doi = {10.1109/TIE.2009.2034179},
url = {http://dx.doi.org/10.1109/TIE.2009.2034179},
researchr = {https://researchr.org/publication/XuKC10},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {57},
number = {6},
pages = {2142-2150},
}