Yongjun Xu, Zuying Luo, Xiaowei Li, Li-Jian Li, Xianlong Hong. Leakage Current Estimation of CMOS Circuit with Stack Effect. J. Comput. Sci. Technol., 19(5):708-717, 2004. [doi]
@article{XuLLLH04,
title = {Leakage Current Estimation of CMOS Circuit with Stack Effect},
author = {Yongjun Xu and Zuying Luo and Xiaowei Li and Li-Jian Li and Xianlong Hong},
year = {2004},
url = {http://jcst.ict.ac.cn/cone/cone45.html#paper16},
researchr = {https://researchr.org/publication/XuLLLH04},
cites = {0},
citedby = {0},
journal = {J. Comput. Sci. Technol.},
volume = {19},
number = {5},
pages = {708-717},
}