Cross version defect prediction with representative data via sparse subset selection

Zhou Xu, Shuai Li, Yutian Tang, Xiapu Luo, Tao Zhang 0001, Jin Liu, Jun Xu. Cross version defect prediction with representative data via sparse subset selection. In Foutse Khomh, Chanchal K. Roy, Janet Siegmund, editors, Proceedings of the 26th Conference on Program Comprehension, ICPC 2018, Gothenburg, Sweden, May 27-28, 2018. pages 132-143, ACM, 2018. [doi]

@inproceedings{XuLTLZLX18,
  title = {Cross version defect prediction with representative data via sparse subset selection},
  author = {Zhou Xu and Shuai Li and Yutian Tang and Xiapu Luo and Tao Zhang 0001 and Jin Liu and Jun Xu},
  year = {2018},
  doi = {10.1145/3196321.3196331},
  url = {https://doi.org/10.1145/3196321.3196331},
  researchr = {https://researchr.org/publication/XuLTLZLX18},
  cites = {0},
  citedby = {0},
  pages = {132-143},
  booktitle = {Proceedings of the 26th Conference on Program Comprehension, ICPC 2018, Gothenburg, Sweden, May 27-28, 2018},
  editor = {Foutse Khomh and Chanchal K. Roy and Janet Siegmund},
  publisher = {ACM},
}