Chen Xu, Ji-Gou Liu, Quan Zhang, Chen Xu, Yongcai Yang. Investigation of the thermal drift of open-loop Hall effect current sensor and its improvement. In IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2015, Aachen, Germany, September 23-25, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{XuLZXY15,
title = {Investigation of the thermal drift of open-loop Hall effect current sensor and its improvement},
author = {Chen Xu and Ji-Gou Liu and Quan Zhang and Chen Xu and Yongcai Yang},
year = {2015},
doi = {10.1109/AMPS.2015.7312732},
url = {https://doi.org/10.1109/AMPS.2015.7312732},
researchr = {https://researchr.org/publication/XuLZXY15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2015, Aachen, Germany, September 23-25, 2015},
publisher = {IEEE},
isbn = {978-1-4799-9998-9},
}