Design of Fast-axis Collimated Image Inspection System for Semiconductor Lasers - researchr publication authors

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Peidong Xu, Yang Qian, Pengyu Li, Bin Wang, Yong Wang, Xiantao Wang. Design of Fast-axis Collimated Image Inspection System for Semiconductor Lasers. In 6th IEEE International Conference on Computer and Communication Systems, ICCCS 2021, Chengdu, China, April 23-26, 2021. pages 303-306, IEEE, 2021. [doi]

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