Memory Error Detection Based on Dynamic Binary Translation - researchr publication authors

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Hang Xu, Wei Ren, Zimian Liu, Jiajun Chen, Junhu Zhu. Memory Error Detection Based on Dynamic Binary Translation. In 20th IEEE International Conference on Communication Technology, ICCT 2020, Nanning, China, October 28-31, 2020. pages 1059-1064, IEEE, 2020. [doi]

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