Low Cost Launch-on-Shift Delay Test with Slow Scan Enable

Gefu Xu, Adit D. Singh. Low Cost Launch-on-Shift Delay Test with Slow Scan Enable. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 9-14, IEEE Computer Society, 2006. [doi]

@inproceedings{XuS06:6,
  title = {Low Cost Launch-on-Shift Delay Test with Slow Scan Enable},
  author = {Gefu Xu and Adit D. Singh},
  year = {2006},
  doi = {10.1109/ETS.2006.29},
  url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.29},
  tags = {testing},
  researchr = {https://researchr.org/publication/XuS06%3A6},
  cites = {0},
  citedby = {0},
  pages = {9-14},
  booktitle = {11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2566-0},
}