Liaosa Xu, Sai Wang, Marion R. Reynolds Jr.. A Generalized Likelihood Ratio Control Chart for Monitoring the Process Mean Subject to Linear Drifts. Quality and Reliability Eng. Int., 29(4):545-553, 2013. [doi]
@article{XuWR13,
title = {A Generalized Likelihood Ratio Control Chart for Monitoring the Process Mean Subject to Linear Drifts},
author = {Liaosa Xu and Sai Wang and Marion R. Reynolds Jr.},
year = {2013},
doi = {10.1002/qre.1404},
url = {http://dx.doi.org/10.1002/qre.1404},
researchr = {https://researchr.org/publication/XuWR13},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {29},
number = {4},
pages = {545-553},
}