The study of buffer structure of on-board test s circuit module in high shock

Peng Xu, Jing Zu, Zu-Seng Lin. The study of buffer structure of on-board test s circuit module in high shock. IEEE T. Instrumentation and Measurement, 53(4):1224-1226, 2004. [doi]

Authors

Peng Xu

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Jing Zu

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Zu-Seng Lin

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