Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Shengbo Zhang, Mingyong Huang, Weiran Kong, Shichang Zou. A 280-KBytes Twin-Bit-Cell Embedded NOR Flash Memory With a Novel Sensing Current Protection Enhanced Technique and High-Voltage Generating Systems. IEEE Trans. on Circuits and Systems, 65-II(11):1569-1573, 2018. [doi]
@article{XuZXYHZHKZ18,
title = {A 280-KBytes Twin-Bit-Cell Embedded NOR Flash Memory With a Novel Sensing Current Protection Enhanced Technique and High-Voltage Generating Systems},
author = {Yiran Xu and Wenyi Zhu and Jun Xiao and Guangjun Yang and Jian Hu and Shengbo Zhang and Mingyong Huang and Weiran Kong and Shichang Zou},
year = {2018},
doi = {10.1109/TCSII.2017.2764179},
url = {https://doi.org/10.1109/TCSII.2017.2764179},
researchr = {https://researchr.org/publication/XuZXYHZHKZ18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {65-II},
number = {11},
pages = {1569-1573},
}