Improved Toolchain-Compatible Standard Cells with 5% - 36% Lower EDP for Super Threshold Operation in 65nm Low-Power CMOS Technology

Shubham Yadav, André B. J. Kokkeler, Mark S. Oude Alink. Improved Toolchain-Compatible Standard Cells with 5% - 36% Lower EDP for Super Threshold Operation in 65nm Low-Power CMOS Technology. In IEEE International Symposium on Circuits and Systems, ISCAS 2023, Monterey, CA, USA, May 21-25, 2023. pages 1-5, IEEE, 2023. [doi]