Total Dose Tolerance Analysis of an Optically Reconfigurable Gate Array VLSI - researchr publication authors

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Kaho Yamada, Takeshi Okazaki, Minoru Watanabe, Nobuya Watanabe. Total Dose Tolerance Analysis of an Optically Reconfigurable Gate Array VLSI. In 29th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2022, Glasgow, United Kingdom, October 24-26, 2022. pages 1-4, IEEE, 2022. [doi]

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