Toshihiko Yamasaki, Tsuhan Chen. Confidence-assisted classification result refinement for object recognition featuring TopN-Exemplar-SVM. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 1783-1786, IEEE, 2012. [doi]
@inproceedings{YamasakiC12-0,
title = {Confidence-assisted classification result refinement for object recognition featuring TopN-Exemplar-SVM},
author = {Toshihiko Yamasaki and Tsuhan Chen},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6460497},
researchr = {https://researchr.org/publication/YamasakiC12-0},
cites = {0},
citedby = {0},
pages = {1783-1786},
booktitle = {Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2216-4},
}