Redundant wire insertion for yield improvement

Jin-Tai Yan, Zhi-Wei Chen. Redundant wire insertion for yield improvement. In Fabrizio Lombardi, Sanjukta Bhanja, Yehia Massoud, R. Iris Bahar, editors, Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009. pages 409-412, ACM, 2009. [doi]

@inproceedings{YanC09a,
  title = {Redundant wire insertion for yield improvement},
  author = {Jin-Tai Yan and Zhi-Wei Chen},
  year = {2009},
  doi = {10.1145/1531542.1531635},
  url = {http://doi.acm.org/10.1145/1531542.1531635},
  researchr = {https://researchr.org/publication/YanC09a},
  cites = {0},
  citedby = {0},
  pages = {409-412},
  booktitle = {Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009},
  editor = {Fabrizio Lombardi and Sanjukta Bhanja and Yehia Massoud and R. Iris Bahar},
  publisher = {ACM},
  isbn = {978-1-60558-522-2},
}