Yizhou Yan, Lei Cao, Elke A. Rundensteiner. Scalable Top-n Local Outlier Detection. In Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Halifax, NS, Canada, August 13 - 17, 2017. pages 1235-1244, ACM, 2017. [doi]
@inproceedings{YanCR17,
title = {Scalable Top-n Local Outlier Detection},
author = {Yizhou Yan and Lei Cao and Elke A. Rundensteiner},
year = {2017},
doi = {10.1145/3097983.3098191},
url = {http://doi.acm.org/10.1145/3097983.3098191},
researchr = {https://researchr.org/publication/YanCR17},
cites = {0},
citedby = {0},
pages = {1235-1244},
booktitle = {Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Halifax, NS, Canada, August 13 - 17, 2017},
publisher = {ACM},
isbn = {978-1-4503-4887-4},
}