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Comparative Study of Single Event Transient Effects on Dynamic Comparator in Bulk CMOS

Ming Yan, Kamal El-Sankary, Li Chen. Comparative Study of Single Event Transient Effects on Dynamic Comparator in Bulk CMOS. In 32nd IEEE International Conference on Electronics, Circuits and Systems, ICECS 2025, Marrakech, Morocco, November 17-19, 2025. pages 1-4, IEEE, 2025. [doi]

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Ming Yan

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Kamal El-Sankary

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Li Chen

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