Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments

Aibin Yan, Xiangfeng Feng, Yuanjie Hu, Chaoping Lai, Jie Cui 0004, Zhili Chen, Kohei Miyase, Xiaoqing Wen. Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments. IEEE Trans. Aerospace and Electronic Systems, 56(2):1163-1171, 2020. [doi]

@article{YanFHLCCMW20,
  title = {Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments},
  author = {Aibin Yan and Xiangfeng Feng and Yuanjie Hu and Chaoping Lai and Jie Cui 0004 and Zhili Chen and Kohei Miyase and Xiaoqing Wen},
  year = {2020},
  doi = {10.1109/TAES.2019.2925448},
  url = {https://doi.org/10.1109/TAES.2019.2925448},
  researchr = {https://researchr.org/publication/YanFHLCCMW20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Aerospace and Electronic Systems},
  volume = {56},
  number = {2},
  pages = {1163-1171},
}