Degradation modeling and remaining useful life prediction for dependent competing failure processes

Tao Yan, Yaguo Lei, Naipeng Li, Biao Wang, Wenting Wang. Degradation modeling and remaining useful life prediction for dependent competing failure processes. Rel. Eng. & Sys. Safety, 212:107638, 2021. [doi]

Authors

Tao Yan

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Yaguo Lei

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Naipeng Li

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Biao Wang

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Wenting Wang

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