Xiaobo Yan, Bin Liu 0032, Shihai Wang. A Test Restoration Method based on Genetic Algorithm for effective fault localization in multiple-fault programs. Journal of Systems and Software, 172:110861, 2021. [doi]
@article{YanLW21,
title = {A Test Restoration Method based on Genetic Algorithm for effective fault localization in multiple-fault programs},
author = {Xiaobo Yan and Bin Liu 0032 and Shihai Wang},
year = {2021},
doi = {10.1016/j.jss.2020.110861},
url = {https://doi.org/10.1016/j.jss.2020.110861},
researchr = {https://researchr.org/publication/YanLW21},
cites = {0},
citedby = {0},
journal = {Journal of Systems and Software},
volume = {172},
pages = {110861},
}