Haidong Yan, Yun-Hui Mei, Xin Li, Pu Zhang, Guo-Quan Lu. Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions. Microelectronics Reliability, 55(12):2532-2541, 2015. [doi]
@article{YanMLZL15,
title = {Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions},
author = {Haidong Yan and Yun-Hui Mei and Xin Li and Pu Zhang and Guo-Quan Lu},
year = {2015},
doi = {10.1016/j.microrel.2015.07.037},
url = {http://dx.doi.org/10.1016/j.microrel.2015.07.037},
researchr = {https://researchr.org/publication/YanMLZL15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {12},
pages = {2532-2541},
}