Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations

Takeshi Yanagisawa, Takeshi Kojima. Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. Microelectronics Reliability, 43(6):977-980, 2003. [doi]

Authors

Takeshi Yanagisawa

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Takeshi Kojima

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