Bin (Frank) Yang, Ming Cai. Advanced strain engineering for state-of-the-art nanoscale CMOS technology. Science in China Series F: Information Sciences, 54(5):946-958, 2011. [doi]
@article{YangC11-1,
title = {Advanced strain engineering for state-of-the-art nanoscale CMOS technology},
author = {Bin (Frank) Yang and Ming Cai},
year = {2011},
doi = {10.1007/s11432-011-4224-9},
url = {http://dx.doi.org/10.1007/s11432-011-4224-9},
researchr = {https://researchr.org/publication/YangC11-1},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {54},
number = {5},
pages = {946-958},
}