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Accelerated-compensated degradation modeling based on synthesized-stress enhancement test data

Nina Yang, Jing Feng, Tianyu Liu, Zhengqiang Pan, Jieru Meng. Accelerated-compensated degradation modeling based on synthesized-stress enhancement test data. In 2nd International Conference on System Reliability and Safety, ICSRS 2017, Milan, Italy, December 20-22, 2017. pages 261-269, IEEE, 2017. [doi]

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Nina Yang

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Jing Feng

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Tianyu Liu

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Zhengqiang Pan

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Jieru Meng

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