Juefei Yang, Saeed Jahdi, Bernard H. Stark, Ruizhu Wu, Olayiwola Alatise, Jose Angel Ortiz Gonzalez. Impact of Temperature and Switching Rate on Properties of Crosstalk on Symmetrical & Asymmetrical Double-trench SiC Power MOSFET. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{YangJSWAG21,
title = {Impact of Temperature and Switching Rate on Properties of Crosstalk on Symmetrical & Asymmetrical Double-trench SiC Power MOSFET},
author = {Juefei Yang and Saeed Jahdi and Bernard H. Stark and Ruizhu Wu and Olayiwola Alatise and Jose Angel Ortiz Gonzalez},
year = {2021},
doi = {10.1109/IECON48115.2021.9589773},
url = {https://doi.org/10.1109/IECON48115.2021.9589773},
researchr = {https://researchr.org/publication/YangJSWAG21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3554-3},
}