Tong Yang, Yuguo Liu, Changxin Jin, Kai Jiang, Qiang Duan, Chen Song, Qibin Chen, Xue Li, Junzheng Ge, Rui Li. Printed Circuit Board Defect Detection Based on Improved YOLOv5. In 6th International Conference on Information and Computer Technologies, ICICT 2023, Raleigh, NC, USA, March 24-26, 2023. pages 72-77, IEEE, 2023. [doi]
@inproceedings{YangLJJDSCLGL23,
title = {Printed Circuit Board Defect Detection Based on Improved YOLOv5},
author = {Tong Yang and Yuguo Liu and Changxin Jin and Kai Jiang and Qiang Duan and Chen Song and Qibin Chen and Xue Li and Junzheng Ge and Rui Li},
year = {2023},
doi = {10.1109/ICICT58900.2023.00019},
url = {https://doi.org/10.1109/ICICT58900.2023.00019},
researchr = {https://researchr.org/publication/YangLJJDSCLGL23},
cites = {0},
citedby = {0},
pages = {72-77},
booktitle = {6th International Conference on Information and Computer Technologies, ICICT 2023, Raleigh, NC, USA, March 24-26, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0095-6},
}