Jiasen Yang, Qiang Liu, Vinayak Rao, Jennifer Neville. Goodness-of-fit Testing for Discrete Distributions via Stein Discrepancy. In Jennifer G. Dy, Andreas Krause 0001, editors, Proceedings of the 35th International Conference on Machine Learning, ICML 2018, Stockholmsmässan, Stockholm, Sweden, July 10-15, 2018. Volume 80 of JMLR Workshop and Conference Proceedings, pages 5557-5566, JMLR.org, 2018. [doi]
@inproceedings{YangLRN18,
title = {Goodness-of-fit Testing for Discrete Distributions via Stein Discrepancy},
author = {Jiasen Yang and Qiang Liu and Vinayak Rao and Jennifer Neville},
year = {2018},
url = {http://proceedings.mlr.press/v80/yang18c.html},
researchr = {https://researchr.org/publication/YangLRN18},
cites = {0},
citedby = {0},
pages = {5557-5566},
booktitle = {Proceedings of the 35th International Conference on Machine Learning, ICML 2018, Stockholmsmässan, Stockholm, Sweden, July 10-15, 2018},
editor = {Jennifer G. Dy and Andreas Krause 0001},
volume = {80},
series = {JMLR Workshop and Conference Proceedings},
publisher = {JMLR.org},
}