Xinli Yang, David Lo, Xin Xia, Yun Zhang, Jianling Sun. Deep Learning for Just-in-Time Defect Prediction. In 2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Vancouver, BC, Canada, August 3-5, 2015. pages 17-26, IEEE, 2015. [doi]
@inproceedings{YangLXZS15,
title = {Deep Learning for Just-in-Time Defect Prediction},
author = {Xinli Yang and David Lo and Xin Xia and Yun Zhang and Jianling Sun},
year = {2015},
doi = {10.1109/QRS.2015.14},
url = {http://dx.doi.org/10.1109/QRS.2015.14},
researchr = {https://researchr.org/publication/YangLXZS15},
cites = {0},
citedby = {0},
pages = {17-26},
booktitle = {2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Vancouver, BC, Canada, August 3-5, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7989-2},
}