A New Coefficient for a Two-Scale Microfacet Reflectance Model

Hongbin Yang, Mingxue Liao, Changwen Zheng, Pin Lv. A New Coefficient for a Two-Scale Microfacet Reflectance Model. In Yao Zhao, Nick Barnes, Baoquan Chen, RĂ¼diger Westermann, Xiangwei Kong, Chunyu Lin, editors, Image and Graphics - 10th International Conference, ICIG 2019, Beijing, China, August 23-25, 2019, Proceedings, Part II. Volume 11902 of Lecture Notes in Computer Science, pages 208-219, Springer, 2019. [doi]

@inproceedings{YangLZL19,
  title = {A New Coefficient for a Two-Scale Microfacet Reflectance Model},
  author = {Hongbin Yang and Mingxue Liao and Changwen Zheng and Pin Lv},
  year = {2019},
  doi = {10.1007/978-3-030-34110-7_18},
  url = {https://doi.org/10.1007/978-3-030-34110-7_18},
  researchr = {https://researchr.org/publication/YangLZL19},
  cites = {0},
  citedby = {0},
  pages = {208-219},
  booktitle = {Image and Graphics - 10th International Conference, ICIG 2019, Beijing, China, August 23-25, 2019, Proceedings, Part II},
  editor = {Yao Zhao and Nick Barnes and Baoquan Chen and RĂ¼diger Westermann and Xiangwei Kong and Chunyu Lin},
  volume = {11902},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-030-34110-7},
}