A Stein-Papangelou Goodness-of-Fit Test for Point Processes - researchr publication authors

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Jiasen Yang, Vinayak Rao, Jennifer Neville. A Stein-Papangelou Goodness-of-Fit Test for Point Processes. In Kamalika Chaudhuri, Masashi Sugiyama, editors, The 22nd International Conference on Artificial Intelligence and Statistics, AISTATS 2019, 16-18 April 2019, Naha, Okinawa, Japan. Volume 89 of Proceedings of Machine Learning Research, pages 226-235, PMLR, 2019. [doi]

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