Enhancement-Mode HEMT Performance and Mitigating Delay Through Double-Heterojunction With Connect Channel Utilization for Trap Effect Reduction

Longfei Yang, Huiqing Sun, Ruipeng Lv, Zhen Liu, Yuanhao Zhang, Penglin Wang, Yuan Li, Yong Huang, Zhiyou Guo. Enhancement-Mode HEMT Performance and Mitigating Delay Through Double-Heterojunction With Connect Channel Utilization for Trap Effect Reduction. IEEE Access, 11:134230-134238, 2023. [doi]

@article{YangSLLZWLHG23,
  title = {Enhancement-Mode HEMT Performance and Mitigating Delay Through Double-Heterojunction With Connect Channel Utilization for Trap Effect Reduction},
  author = {Longfei Yang and Huiqing Sun and Ruipeng Lv and Zhen Liu and Yuanhao Zhang and Penglin Wang and Yuan Li and Yong Huang and Zhiyou Guo},
  year = {2023},
  doi = {10.1109/ACCESS.2023.3336990},
  url = {https://doi.org/10.1109/ACCESS.2023.3336990},
  researchr = {https://researchr.org/publication/YangSLLZWLHG23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {11},
  pages = {134230-134238},
}