Test Accuracy vs. Generalization Gap: Model Selection in NLP without Accessing Training or Testing Data

Yaoqing Yang, Ryan Theisen, Liam Hodgkinson, Joseph E. Gonzalez, Kannan Ramchandran, Charles H. Martin, Michael W. Mahoney. Test Accuracy vs. Generalization Gap: Model Selection in NLP without Accessing Training or Testing Data. In Ambuj Singh, Yizhou Sun, Leman Akoglu, Dimitrios Gunopulos, Xifeng Yan, Ravi Kumar 0001, Fatma Ozcan, Jieping Ye, editors, Proceedings of the 29th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, KDD 2023, Long Beach, CA, USA, August 6-10, 2023. pages 3011-3021, ACM, 2023. [doi]

@inproceedings{YangTHGRMM23,
  title = {Test Accuracy vs. Generalization Gap: Model Selection in NLP without Accessing Training or Testing Data},
  author = {Yaoqing Yang and Ryan Theisen and Liam Hodgkinson and Joseph E. Gonzalez and Kannan Ramchandran and Charles H. Martin and Michael W. Mahoney},
  year = {2023},
  doi = {10.1145/3580305.3599518},
  url = {https://doi.org/10.1145/3580305.3599518},
  researchr = {https://researchr.org/publication/YangTHGRMM23},
  cites = {0},
  citedby = {0},
  pages = {3011-3021},
  booktitle = {Proceedings of the 29th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, KDD 2023, Long Beach, CA, USA, August 6-10, 2023},
  editor = {Ambuj Singh and Yizhou Sun and Leman Akoglu and Dimitrios Gunopulos and Xifeng Yan and Ravi Kumar 0001 and Fatma Ozcan and Jieping Ye},
  publisher = {ACM},
}