Applying testability to reliability estimation

Mark C. K. Yang, W. Eric Wong, Alberto Pasquini. Applying testability to reliability estimation. In Ninth International Symposium on Software Reliability Engineering, ISSRE 1998, Paderborn, Germany, November 4-7, 1998. pages 90-99, IEEE Computer Society, 1998. [doi]

@inproceedings{YangWP98-0,
  title = {Applying testability to reliability estimation},
  author = {Mark C. K. Yang and W. Eric Wong and Alberto Pasquini},
  year = {1998},
  doi = {10.1109/ISSRE.1998.730848},
  url = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.1998.730848},
  researchr = {https://researchr.org/publication/YangWP98-0},
  cites = {0},
  citedby = {0},
  pages = {90-99},
  booktitle = {Ninth International Symposium on Software Reliability Engineering, ISSRE 1998, Paderborn, Germany, November 4-7, 1998},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-8991-9},
}