Lin-An Yang, Chun-Li Yu, Yue Hao. A new model of subthreshold swing for sub-100 nm MOSFETs. Microelectronics Reliability, 48(3):342-347, 2008. [doi]
@article{YangYH08-0,
title = {A new model of subthreshold swing for sub-100 nm MOSFETs},
author = {Lin-An Yang and Chun-Li Yu and Yue Hao},
year = {2008},
doi = {10.1016/j.microrel.2007.06.007},
url = {http://dx.doi.org/10.1016/j.microrel.2007.06.007},
researchr = {https://researchr.org/publication/YangYH08-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {3},
pages = {342-347},
}