Chi W. Yau. Concurrent Test Generation Using AI Techniques. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 722-731, IEEE Computer Society, 1986.
@inproceedings{Yau86,
title = {Concurrent Test Generation Using AI Techniques},
author = {Chi W. Yau},
year = {1986},
tags = {testing},
researchr = {https://researchr.org/publication/Yau86},
cites = {0},
citedby = {0},
pages = {722-731},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}