S. S. Yau, Y. S. Tang. Generation of Shortest Test Sequences for Detecting Individual Faults of Sequential Circuits. Comput. J., 22(2):169-172, 1979.
@article{YauT79, title = {Generation of Shortest Test Sequences for Detecting Individual Faults of Sequential Circuits}, author = {S. S. Yau and Y. S. Tang}, year = {1979}, tags = {testing}, researchr = {https://researchr.org/publication/YauT79}, cites = {0}, citedby = {0}, journal = {Comput. J.}, volume = {22}, number = {2}, pages = {169-172}, }